Applications

The EHP-50F is a frequency selective measurement system for electrical and magnetical fields from 1 Hz to 400 kHz with a dynamic of 150 dB. Selective as well as broadband measurements are simultaneously possible.

The casing contains electrical and magnetical sensors, which are in isotrope disposal and an implemented FFT analysator.

  • Isotropic measurements with a dynamic area of 150dB
  • Small dimensions and optical connection for single point measurements
  • Spectrum analysis with integrated FFT
  • Broadband measurements possible
  • Implemented, rechargeable Li-Ion battery with a high lifespan
  • Optical interface to connect with a PC or NBM-550 (non influence on the field)
  • Independent and continuing data recording up to 24 h
  • Weighted peak measurements in regards to EMF Directive 2013/35/EU
  • Time-Domain measurements for exactly capture of complex signal forms

Click here to view the differences between the ELT-400 and the EHP-50F.

Frequency range1 Hz - 400 kHz
Dynamic range150 dB
Measurement range E-Feld

Low: 5 mV/m to 1 kV/m

High: 500 mV/m to 100 kV/m

Measurement range H-Feld

Low: 0,3 nT to 100 µT

High: 30 nT to 100 mT

Temprature range-20°C to +55°C
Weight550 g
Dimensions109 mm  x 92 mm x 92mm

- Externe Anzeige- und Datenspeichereinheit: NBM-550

  • Power supply: Low-frequency radiation sources are all the plants of power supply as high voltage power lines and transformer stations. High frequency radiation sources can be transmitters on high voltage transmission lines
  • Industry: Radiation sources are primarily systems for electrolysis, plants for melting, heating, hardening, plastic welding and for semiconductor production into consideration.

- EHP-TS Software (im Lieferumfang enthalten)

Product images (5)

Ankündigung: Schulungen und Events 201720. Jan. 2017

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Factory calibration

Factory calibration

During a factory calibration, not only the characteristic data is checked but also a comprehensive functional test and minor, preventive maintenance work is made to increase the reliability of the measuring devices and prevent possible failures.

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